Thermal characterization of the SiO[sub 2]-Ge[sub 2]Sb[sub 2]Te[sub 5] interface from room temperature up to 400 °C
Battaglia, J.-L., Kusiak, A., Schick, V., Cappella, A., Wiemer, C., Longo, M., Varesi, E.Volume:
107
Year:
2010
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.3284084
File:
PDF, 580 KB
english, 2010