[IEEE 2012 IEEE/MTT-S International Microwave Symposium - MTT 2012 - Montreal, QC, Canada (2012.06.17-2012.06.22)] 2012 IEEE/MTT-S International Microwave Symposium Digest - Characterization of free falling drops inside a microwave cavity
Cabanes-Sempere, M., Cozzo, C., Catala-Civera, J.M., Penaranda-Foix, F.L., Ishizaki, K., Vaucher, S., Pouchon, M.A.Year:
2012
Language:
english
DOI:
10.1109/mwsym.2012.6259757
File:
PDF, 416 KB
english, 2012