Defects in Ge[sup +]-preamorphized silicon

Journal of Applied Physics 1999 Vol. 86; Iss. 10

Defects in Ge[sup +]-preamorphized silicon

Chen, Peng-Shiu, Hsieh, T. E., Hwang, Yih-Chyang, Chu, Chih-Hsun
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Volume:
86
Year:
1999
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.371537
File:
PDF, 768 KB
english, 1999
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