Modulating the field-effect passivation at the SiO2/c-Si...

Modulating the field-effect passivation at the SiO2/c-Si interface: Analysis and verification of the photoluminescence imaging under applied bias method

Haug, Halvard, Olibet, Sara, Nordseth, Ornulf, Stensrud Marstein, Erik
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Volume:
114
Year:
2013
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.4827417
File:
PDF, 1.61 MB
english, 2013
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