[IEEE Design, Automation & Test in Europe Conference - Nice, France (2007.04.16-2007.04.20)] 2007 Design, Automation & Test in Europe Conference & Exhibition - A New Asymmetric SRAM Cell to Reduce Soft Errors and Leakage Power in FPGA
Gill, Balkaran S., Papachristou, Chris, Wolff, Francis G.Year:
2007
Language:
english
DOI:
10.1109/date.2007.364504
File:
PDF, 184 KB
english, 2007