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[IEEE 2012 Conference on Precision Electromagnetic Measurements (CPEM 2012) - Washington, DC, USA (2012.07.1-2012.07.6)] 2012 Conference on Precision electromagnetic Measurements - Mismatch analysis using pulsed electro-optic sampling at KRISS
Lee, Dong-Joon, Kwon, Jae-Yong, Lee, Joo-Gwang, Kang, No-WeonYear:
2012
Language:
english
DOI:
10.1109/cpem.2012.6250996
File:
PDF, 625 KB
english, 2012