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[IEEE 2010 10th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT) - Shanghai, China (2010.11.1-2010.11.4)] 2010 10th IEEE International Conference on Solid-State and Integrated Circuit Technology - Predictive modeling of capacitance and resistance in gate-all-around cylindrical nanowire MOSFETs for parasitic design optimization
Xu, Qiumin, Zou, Jibin, Luo, Jieyin, Wang, Runsheng, Huang, RuYear:
2010
Language:
english
DOI:
10.1109/icsict.2010.5667822
File:
PDF, 393 KB
english, 2010