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Direct evidence for diffusion and electromigration of Cu in CuInSe[sub 2]
Gartsman, Konstantin, Chernyak, Leonid, Lyahovitskaya, Vera, Cahen, David, Didik, Vladimir, Kozlovsky, Vitaliy, Malkovich, Roald, Skoryatina, Elena, Usacheva, ValentinaVolume:
82
Year:
1997
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.366252
File:
PDF, 889 KB
english, 1997