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[IEEE 2007 International Semiconductor Device Research Symposium - College Park, MD, USA (2007.12.12-2007.12.14)] 2007 International Semiconductor Device Research Symposium - Simultaneous study of nickel based ohmic contacts to Si-face and C-face of n-type silicon carbide
Ghandi, R., Lee, H-S., Domeij, M., Zetterling, C-M., Ostling, M.Year:
2007
Language:
english
DOI:
10.1109/isdrs.2007.4422387
File:
PDF, 129 KB
english, 2007