[IEEE 2006 IEEE Instrumentation and Measurement Technology...

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[IEEE 2006 IEEE Instrumentation and Measurement Technology - Sorrento, Italy (2006.04.24-2006.04.27)] 2006 IEEE Instrumentation and Measurement Technology Conference Proceedings - A Fuzzy Approach to represent Measurement Data affected by both A-type and B-type Uncertainty

DeCapua, Claudio, Romeo, Emilia
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Year:
2006
Language:
english
DOI:
10.1109/imtc.2006.328644
File:
PDF, 182 KB
english, 2006
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