Understanding Thickness Effects in Thin Film Capacitors
LOOKMAN, A., BOWMAN, R. M., GREGG, J. M., SCOTT, J. F., DAWBER, MATT, RUEDIGER, A.Volume:
61
Language:
english
Journal:
Integrated Ferroelectrics
DOI:
10.1080/10584580490458856
Date:
August, 2004
File:
PDF, 163 KB
english, 2004