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[IEEE 2013 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with NSREC 2013) - San Francisco, CA, USA (2013.07.8-2013.07.12)] 2013 IEEE Radiation Effects Data Workshop (REDW) - Radiation Tolerant MESFET-CMOS Low Dropout Linear Regulator for Integrated Power Management at the 45nm Node
Thornton, Trevor J., Lepkowski, William, Wilk, Seth J., Goryll, Michael, Chen, Bo, Kam, Jason, Bakkaloglu, Bertan, Holbert, KeithYear:
2013
Language:
english
DOI:
10.1109/redw.2013.6658204
File:
PDF, 228 KB
english, 2013