Gated Diode Design to Mitigate Radiation Damage in X-Ray Imagers
Zelakiewicz, Scott, Albagli, Douglas, Hennessy, William, Couture, AaronVolume:
29
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/led.2007.910788
Date:
January, 2008
File:
PDF, 185 KB
english, 2008