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[IEEE 2008 15th International Symposium on the Physical and Failure Analysis of Integrated Circuits - singapore (2008.07.7-2008.07.11)] 2008 15th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Current-induced breakdown of carbon nanofiber interconnects
Hirohiko Kitsuki,, Tsutomu Saito,, Toshishige Yamada,, Drazen Fabris,, Wilhite, Patrick, Makoto Suzuki,, Yang, Cary Y.Year:
2008
Language:
english
DOI:
10.1109/ipfa.2008.4588210
File:
PDF, 945 KB
english, 2008