High-resolution piezoresponse force microscopy...

Applied Physics Letters 2006 Vol. 89; Iss. 13

High-resolution piezoresponse force microscopy investigation of imprint in ferroelectric thin films

Anbusathaiah, V., Nagarajan, V., Aggarwal, S.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
89
Year:
2006
Language:
english
Journal:
Applied Physics Letters
DOI:
10.1063/1.2357894
File:
PDF, 631 KB
english, 2006
Conversion to is in progress
Conversion to is failed