Properties of interface-engineered high T[sub c] Josephson...

Applied Physics Letters 1997 Vol. 71; Iss. 17

Properties of interface-engineered high T[sub c] Josephson junctions

Moeckly, B. H., Char, K.
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Volume:
71
Year:
1997
Language:
english
Journal:
Applied Physics Letters
DOI:
10.1063/1.120107
File:
PDF, 268 KB
english, 1997
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