Scanning Electron Microscope as a Means of Studying...

Journal of Applied Physics 1966 Vol. 37; Iss. 4

Scanning Electron Microscope as a Means of Studying Microplasmas at High Resolution

Neve, N. F. B.
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Volume:
37
Year:
1966
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.1708587
File:
PDF, 872 KB
english, 1966
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