Scanning tunneling microscopy imaging of charged defects on...

Scanning tunneling microscopy imaging of charged defects on clean Si(100)-(2×1)

Brown, G. W., Grube, H., Hawley, M. E., Schofield, S. R., Curson, N. J., Simmons, M. Y., Clark, R. G.

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Volume:

Year:

2003

Language:

english

Journal:

Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films

DOI:

10.1116/1.1566973

File:

PDF, 677 KB

english, 2003

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