Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures
2010 Vol. 28; Iss. 3
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Thermal expansion of GaSb measured by temperature dependent x-ray diffraction
Nilsen, Tron Arne, Breivik, Magnus, Myrvågnes, Geir, Fimland, Bjo̸rn-OveVolume:
28
Year:
2010
Language:
english
Journal:
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures
DOI:
10.1116/1.3336341
File:
PDF, 385 KB
english, 2010