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Application of photoreflectance spectroscopy to the study of interface roughness in InGaAs/InAlAs heterointerfaces
Bru-Chevallier, Catherine, Baltagi, Youssef, Guillot, Gérard, Hong, Kyushik, Pavlidis, DimitrisVolume:
84
Year:
1998
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.368816
File:
PDF, 350 KB
english, 1998