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The C[sub i]C[sub s](Si[sub I]) defect in silicon: An infrared spectroscopy study
Potsidi, M. S., Londos, C. A.Volume:
100
Year:
2006
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.2227634
File:
PDF, 365 KB
english, 2006