[IEEE 2009 IEEE International Symposium on Electromagnetic Compatibility - EMC 2009 - Austin, TX, USA (2009.08.17-2009.08.21)] 2009 IEEE International Symposium on Electromagnetic Compatibility - Using the Feature Selective Validation technique to compare CEM code predictions and measurements of field distributions for cavity problems
Drozd, Andrew L., Kasperovich, Irina, Carroll, Clifford E.Year:
2009
Language:
english
DOI:
10.1109/isemc.2009.5284653
File:
PDF, 382 KB
english, 2009