[IEEE 2008 IEEE International Symposium on Electromagnetic Compatibility - EMC 2008 - Detroit, MI (2008.08.18-2008.08.22)] 2008 IEEE International Symposium on Electromagnetic Compatibility - Line replaceable unit interface testing upset testing using the R2SPG technique and Terminal Protection Device (TPD) testing
Hoeft, LotharYear:
2008
Language:
english
DOI:
10.1109/isemc.2008.4652211
File:
PDF, 368 KB
english, 2008