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[IEEE 2010 Symposium on Photonics and Optoelectronics (SOPO 2010) - Chengdu, China (2010.06.19-2010.06.21)] 2010 Symposium on Photonics and Optoelectronics - Characterization of Trap States Distribution in Poly-Si TFTs Using OEMS
Huang, Junkai, Jiang, Xiaozhou, Deng, Wanling, Zheng, Xueren, Liu, TaoYear:
2010
Language:
english
DOI:
10.1109/sopo.2010.5504394
File:
PDF, 311 KB
english, 2010