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First infrared spectroscopic characterization of the disilyl (Si2H5) and d5-disilyl (Si2D5) radicals in low temperature silane matrices
David Sillars, Chris J. Bennett, Yoshihiro Osamura, Ralf I. KaiserVolume:
305
Year:
2004
Language:
english
Pages:
13
DOI:
10.1016/j.chemphys.2004.05.035
File:
PDF, 551 KB
english, 2004