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Ultrahigh vacuum scanning force/scanning tunneling microscope: Application to high-resolution imaging of Si(111)7×7
Olsson, L., Wigren, R., Erlandsson, R.Volume:
67
Year:
1996
Language:
english
Journal:
Review of Scientific Instruments
DOI:
10.1063/1.1146935
File:
PDF, 565 KB
english, 1996