Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures
1993 / 11 Vol. 11; Iss. 6
Spatial-phase-locked electron-beam lithography: Initial test results
Ferrera, JuanVolume:
11
Language:
english
Journal:
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures
DOI:
10.1116/1.586983
Date:
November, 1993
File:
PDF, 653 KB
english, 1993