[IEEE 2012 IEEE 11th International Conference on Solid-State and Integrated Circuit Technology (ICSICT) - Xian, China (2012.10.29-2012.11.1)] 2012 IEEE 11th International Conference on Solid-State and Integrated Circuit Technology - A reduced surface current LDMOS with stronger ESD robustness
Jiang, Lingli, Fan, Hang, He, Chuan, Zhang, BoYear:
2012
DOI:
10.1109/icsict.2012.6467851
File:
PDF, 229 KB
2012