[IEEE IEEE InternationalElectron Devices Meeting, 2005....

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[IEEE IEEE InternationalElectron...

[IEEE IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest. - Tempe, Arizon, USA (Dec. 5, 2005)] IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest. - Design of high performance PFETs with strained si channel and laser anneal

Luo, Z., Chong, Y.F., Kim, J., Rovedo, N., Greene, B., Panda, S., Sato, T., Holt, J., Chidambarrao, D., Li, J., Davis, R., Madan, A., Turansky, A., Gluschenkov, O., Lindsay, R., Ajmera, A., Lee, J., M

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Year:

2005

Language:

english

DOI:

10.1109/iedm.2005.1609388

File:

PDF, 1.71 MB

english, 2005

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