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[IEEE 2009 Twenty-Fourth Annual IEEE Applied Power Electronics Conference and Exposition (APEC) - Washington, DC, USA (2009.02.15-2009.02.19)] 2009 Twenty-Fourth Annual IEEE Applied Power Electronics Conference and Exposition - Characterization of a Trench-Gated IGBT using the split C-V Method
Boyer, L., Notingher, P., Agnel, S.Year:
2009
Language:
english
DOI:
10.1109/apec.2009.4802957
File:
PDF, 13.38 MB
english, 2009