Quantitative characterization of an x-ray source in an...

Review of Scientific Instruments 2000 Vol. 71; Iss. 3

Quantitative characterization of an x-ray source in an x-ray photoelectron spectroscopy system

Pepper, Stephen V., Wheeler, Donald R.
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Volume:
71
Year:
2000
Language:
english
Journal:
Review of Scientific Instruments
DOI:
10.1063/1.1150498
File:
PDF, 370 KB
english, 2000
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