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[IEEE 2011 International Conference on Electric Information and Control Engineering (ICEICE) - Wuhan, China (2011.04.15-2011.04.17)] 2011 International Conference on Electric Information and Control Engineering - Research on method of analog circuit fault diagnosis based on voltage sensitivity ratio
Jun Xu,, Yaohui Zhang,Year:
2011
DOI:
10.1109/iceice.2011.5777460
File:
PDF, 266 KB
2011