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Determining the stress tensor in strained semiconductor structures by using polarized micro-Raman spectroscopy in oblique backscattering configuration
Ossikovski, Razvigor, Nguyen, Quang, Picardi, Gennaro, Schreiber, JoachimVolume:
103
Year:
2008
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.2917314
File:
PDF, 1.03 MB
english, 2008