[IEEE 2009 8th International Conference on Reliability, Maintainability and Safety (ICRMS 2009) - Chengdu, China (2009.07.20-2009.07.24)] 2009 8th International Conference on Reliability, Maintainability and Safety - Research on code pattern automata-based code error pattern automatic detection technique
Hu, Xuan, Liu, Bin, Wang, YichenYear:
2009
Language:
english
DOI:
10.1109/icrms.2009.5270089
File:
PDF, 1.14 MB
english, 2009