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[IEEE 2007 IEEE Industry Applications Annual Meeting - New Orleans, LA, USA (2007.09.23-2007.09.27)] 2007 IEEE Industry Applications Annual Meeting - Apply Rough Set to the Study of Major Influence Factor in Gas Breakdown
Wen, Kun-Li, Nien, Hsiau-Hsian, Lee, Yuan-Piao, Wang, Chien-WenYear:
2007
Language:
english
DOI:
10.1109/07ias.2007.122
File:
PDF, 454 KB
english, 2007