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[IEEE Design, Automation and Test in Europe - Munich, Germany (07-11 March 2005)] Design, Automation and Test in Europe - Area-Efficient Selective Multi-Threshold CMOS Design Methodology for Standby Leakage Power Reduction
Kitahara, T., Kawabe, N., Minami, F., Seta, K., Furusawa, T.Year:
2005
Language:
english
DOI:
10.1109/date.2005.68
File:
PDF, 88 KB
english, 2005