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[IEEE 2013 SBMO/IEEE MTT-S International Microwave and Optoelectronics Conference (IMOC) - Rio de Janeiro, RJ, Brazil (2013.08.4-2013.08.7)] 2013 SBMO/IEEE MTT-S International Microwave & Optoelectronics Conference (IMOC) - New improved version of J1…J4 interferometry method and its application to nanometric vibration measurements
da Cruz Pereira, Fernando, Galeti, Jose Henrique, Higuti, Ricardo Tokio, Kitano, Claudio, Silva, Emilio Carlos NelliYear:
2013
Language:
english
DOI:
10.1109/imoc.2013.6646489
File:
PDF, 905 KB
english, 2013