High-resolution data-acquisition system for high impedance...

High-resolution data-acquisition system for high impedance measurements on semiconductors

Weissfloch, P., Benzaquen, M., Walsh, D.
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Volume:
58
Year:
1987
Language:
english
Journal:
Review of Scientific Instruments
DOI:
10.1063/1.1139380
File:
PDF, 820 KB
english, 1987
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