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[IEEE 2010 IEEE Instrumentation & Measurement Technology Conference Proceedings - Austin, TX, USA (2010.05.3-2010.05.6)] 2010 IEEE Instrumentation & Measurement Technology Conference Proceedings - Approach to the validation function of intelligent sensors based on error's predictors
Rivera-Mejia, Jose, Arzabala-Contreras, Ernesto, Leon-Rubio, Angel G.Year:
2010
Language:
english
DOI:
10.1109/imtc.2010.5488250
File:
PDF, 693 KB
english, 2010