Direct comparative study on the energy level alignments in unoccupied/occupied states of organic semiconductor/electrode interface by constructing in-situ photoemission spectroscopy and Ar gas cluster ion beam sputtering integrated analysis system
Yun, Dong-Jin, Chung, JaeGwan, Kim, Yongsu, Park, Sung-Hoon, Kim, Seong-Heon, Heo, SungVolume:
116
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.4897517
Date:
October, 2014
File:
PDF, 2.24 MB
english, 2014