Direct comparative study on the energy level alignments in...

Direct comparative study on the energy level alignments in unoccupied/occupied states of organic semiconductor/electrode interface by constructing in-situ photoemission spectroscopy and Ar gas cluster ion beam sputtering integrated analysis system

Yun, Dong-Jin, Chung, JaeGwan, Kim, Yongsu, Park, Sung-Hoon, Kim, Seong-Heon, Heo, Sung
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
116
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.4897517
Date:
October, 2014
File:
PDF, 2.24 MB
english, 2014
Conversion to is in progress
Conversion to is failed