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Total Ionizing Dose Effects on FinFET-Based Capacitor-Less 1T-DRAMs
Zhang, En Xia, Fleetwood, Daniel M., El-Mamouni, Farah, Alles, Michael L., Schrimpf, Ronald D., Xiong, Weize, Hobbs, Chris, Akarvardar, Kerem, Cristoloveanu, SorinLanguage:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/tns.2010.2075942
Date:
December, 2010
File:
PDF, 741 KB
english, 2010