Strain relaxation in InAs∕InGaAs quantum dots investigated by photoluminescence and capacitance-voltage profiling
Chen, J. F., Hsiao, R. S., Chen, Y. P., Wang, J. S., Chi, J. Y.Volume:
87
Year:
2005
Language:
english
Journal:
Applied Physics Letters
DOI:
10.1063/1.2081132
File:
PDF, 264 KB
english, 2005