[IEEE 2010 IEEE Instrumentation & Measurement Technology Conference Proceedings - Austin, TX, USA (2010.05.3-2010.05.6)] 2010 IEEE Instrumentation & Measurement Technology Conference Proceedings - An optical-based instrument for halithosis detection
Gonzalez, J, Valledor, M, Campo, JC, Ferrero, FJ, Rodriguez, J, Pereiro, R., Sanz-Medel, AYear:
2010
Language:
english
DOI:
10.1109/imtc.2010.5488045
File:
PDF, 615 KB
english, 2010