A contactless method for measuring the recombination...

Applied Physics Letters 2010 Vol. 97; Iss. 9

A contactless method for measuring the recombination velocity of an individual grain boundary in thin-film photovoltaics

Mendis, B. G., Bowen, L., Jiang, Q. Z.
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Volume:
97
Year:
2010
Language:
english
Journal:
Applied Physics Letters
DOI:
10.1063/1.3486482
File:
PDF, 1011 KB
english, 2010
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