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Microcracks of the thin-film head alumina: "L" cracks and "U" cracks
Chekanov, A.S., Low, T.S., Alli, S., Kolosov, O., Briggs, A.Volume:
32
Language:
english
Journal:
IEEE Transactions on Magnetics
DOI:
10.1109/20.538807
Date:
January, 1996
File:
PDF, 595 KB
english, 1996