Properties of metal-oxide-semiconductor structures with...

Properties of metal-oxide-semiconductor structures with buried layers as deduced from nonequilibrium C(V) measurements

Bach, H. G.
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Volume:
53
Year:
1982
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.331128
File:
PDF, 496 KB
english, 1982
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