[IEEE APCCAS 2010-2010 IEEE Asia Pacific Conference on Circuits and Systems - Kuala Lumpur, Malaysia (2010.12.6-2010.12.9)] 2010 IEEE Asia Pacific Conference on Circuits and Systems - A fast CRAM SEU error detection scheme for FPGAs
Kiun Kiet, Jong, Jun Pin, Tan, Boon Jin, AngYear:
2010
Language:
english
DOI:
10.1109/apccas.2010.5775097
File:
PDF, 1.13 MB
english, 2010