Trap filling measurements to determine the crossover point of Fermi level and midgap level in GaAs by constant capacitance technique
Tomokage, Hajime, Furuta, Hirosuke, Miyamoto, TokuoVolume:
74
Year:
1993
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.355120
File:
PDF, 504 KB
english, 1993