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[IEEE 2008 IEEE International Test Conference - Santa Clara, CA (2008.10.28-2008.10.30)] 2008 IEEE International Test Conference - A New Wafer Level Latent Defect Screening Methodology for Highly Reliable DRAM Using a Response Surface Method
Junghyun Nam,, Sunghoon Chun,, Gibum Koo,, Yanggi Kim,, Byungsoo Moon,, Jonghyoung Lim,, Jaehoon Joo,, Sangseok Kang,, Hoonjung Kim,, Kyeongseon Shin,, Kisang Kang,, Sungho Kang,Year:
2008
Language:
english
DOI:
10.1109/test.2008.4700632
File:
PDF, 1.23 MB
english, 2008