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[IEEE 2012 IEEE International Ultrasonics Symposium - Dresden, Germany (2012.10.7-2012.10.10)] 2012 IEEE International Ultrasonics Symposium - Characterization of thin layers using a frequency domain laser-ultrasonic system
Grunsteidl, C., Roither, J., Veres, I. A., Reitinger, B., Berer, T., Grun, H., Burgholzer, P., Kostenbauer, H., Winkler, J., Traxler, H., Veres, I. A., Berer, T., Burgholzer, P.Year:
2012
Language:
english
DOI:
10.1109/ultsym.2012.0435
File:
PDF, 1010 KB
english, 2012