[IEEE 2012 IEEE International Ultrasonics Symposium -...

  • Main
  • [IEEE 2012 IEEE International...

[IEEE 2012 IEEE International Ultrasonics Symposium - Dresden, Germany (2012.10.7-2012.10.10)] 2012 IEEE International Ultrasonics Symposium - Characterization of thin layers using a frequency domain laser-ultrasonic system

Grunsteidl, C., Roither, J., Veres, I. A., Reitinger, B., Berer, T., Grun, H., Burgholzer, P., Kostenbauer, H., Winkler, J., Traxler, H., Veres, I. A., Berer, T., Burgholzer, P.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
2012
Language:
english
DOI:
10.1109/ultsym.2012.0435
File:
PDF, 1010 KB
english, 2012
Conversion to is in progress
Conversion to is failed